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Intermodulation Atomic Force Microscopy
  KTH/Nordita/SU seminar in Theoretical Physics [before December 2013]

Wednesday 03 December 2008
from 11:00 to 12:00
at FA31
Speaker : David Haviland (Applied Physics, KTH)
Abstract : Atomic Force Microscopy (AFM) is a powerful tool to map the topography of a wide variety of surfaces at the nanometer scale, from insulators to conductors, for both soft and hard matter. Beyond topography mapping, the surface analysis power of the AFM lies in it's ability to measure tip-surface forces. Today such measurements can only be done in a quasistatic way. and presently there is great interest in the AFM community to develop dynamic AFM methods which can more rapidly extract the tip-surface forces while scanning an oscillating cantilever over the surface. I will discuss these developments, and our approach to this problem, which is based on the nonlinear dynamics of the oscillating cantilever when driven with two pure tones.

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